Total internal reflection microscope

ABSTRACT

The total internal reflection microscope has an illumination optical system that relays light from a light source with a relay optical system, forms an image of the light source on the incident pupil plane of the objective lens and irradiates a sample with the illumination light via an objective lens, has an angle adjustment mirror for changing the position of the image of the light source in a direction orthogonal to the optical axis, an optical detector for detecting the intensity of the returning illumination light reflected by the sample and collected by the objective lens, and a controller for determining the operation amount of the angle adjustment mirror, wherein the controller determines the operation amount of the angle adjustment mirror so that the illumination light is totally reflected at the sample based on the change in intensity of the returning light when the angle adjustment mirror is changed.

TECHNICAL FIELD

The present invention relates to a total internal reflection microscope.

BACKGROUND ART

In detecting the illumination angle of a conventional total internalreflection microscope, the total reflection angle has been calculatedand secured by detecting the position of the illumination light in theentrance pupil of the object lens via a CCD or a position sensitivedetector (PSD) (for example, see Patent Document 1). In this case, thepositional precision of the illumination light depends on the resolutionof the detection element and the projection magnification of theincident pupil of the objective lens 16 relative to the detectionelement, and in order to improve precision, an expensive high-resolutiondetection element must be used, or the projection magnification must beincreased and a larger detection optical system must be permitted. Ifthe projection magnification is increased, the size of the detectionelement must also be made larger, leading to cost increase. Describingspecifically, the position detection resolution of a general CCD or PSDis on the order of several μm to several tens of μm, and this multipliedby the reciprocal of the projection magnification of the objective lensfrom the incident pupil to the detection element corresponds to thecollecting position detection precision of the illumination light in theincident pupil.

That is, the higher the projection magnification is, the higher theposition detection precision can be made.

CITATION LIST Patent Literatures

Patent Document 1: US Patent 2010/0171946

SUMMARY OF INVENTION Technical Problem

However, a 60× to 100× incident pupil of an objective lens used fortotal internal reflection microscope observation has a diameter on theorder of 6 to 10 mm, and detection elements of a size that can projectwith a double or triple magnification are generally few and expensive.In a total internal reflection microscope, even if the difference incollecting position at the incident pupil of the objective lens is onthe order of several μm, the observation image is impacted, and changesthe evanescent field penetration depth. Relating thereto, it isdifficult to manage and secure detection precision with a detectionelement that has only a resolution which is on the same order as theseveral μm.

With the foregoing in view, an object of the present invention is toprovide a total internal reflection microscope that can control withgood precision the illumination angle of a total internal reflectionmicroscope and has a simple configuration.

Solution to Problem

In order to resolve the aforementioned problem, the total internalreflection microscope according to the present invention includes anillumination optical system for relaying light from a light source witha relay optical system and forming an image of the light source on theincident pupil of an objective lens or the vicinity thereof andirradiating a sample with the light through the objective lens, thetotal internal reflection microscope including an incident angleadjustment part for changing the position of the image of the lightsource in a direction orthogonal to the optical axis, an opticaldetector for detecting intensity of the returning light that is thelight reflected by the sample and collected by the objective lens, and acontroller for determining the operation amount of the incident angleadjustment part, wherein the controller determines the operation amountof the incident angle adjustment part based on the change in intensityof the returning light when the incident angle adjustment part ischanged.

With this type of total internal reflection microscope, it is preferableto further include a focus lens for changing the position of the imageof the light source in the optical axis direction, wherein thecontroller determines the operation amount of the incident angleadjustment part and the focus lens based on the change in intensity ofthe returning light when the incident angle adjustment part and thefocus lens are changed.

With this type of total internal reflection microscope, it is preferablefor the controller to determine the operation amount of the incidentangle adjustment part so the light is totally reflected at the samplebased on the change in intensity of the returning light when theincident angle adjustment part is changed, and to determine theoperation amount of the focus lens so the light becomes parallel lightbased on the change in intensity of the returning light when the focuslens is changed.

With this type of total internal reflection microscope, the controllerpreferably adjusts the position of the light source image in a directionorthogonal to the optical axis direction in the incident pupil of theobjective lens or the vicinity thereof so that the light is totallyreflected at the sample, and adjusts the position of the light sourceimage in the optical axis direction in the incident pupil of theobjective lens or the vicinity thereof so that the light becomesparallel light.

With this type of total internal reflection microscope, it is preferablefor the controller to identify the boundary of total reflection in thesample and non-total reflection in the sample based on the change in theintensity of the returning light.

With this type of total internal reflection microscope, the controllerpreferably calculates the incident angle of the light relative to thesample based on the amount of change of the incident angle adjustmentpart or the amount of change in the angle formed between the principalray of the light and the optical axis of the relay optical system, whichchanges with the operation of the incident angle adjustment part.

With this type of total internal reflection microscope, the controllerpreferably calculates at least one of either the refractive index of thesample or the evanescent field penetration depth of based on the amountof change of the incident angle adjustment part, or the amount of changein the angle formed between the principal ray of the light and theoptical axis of the relay optical system that changes with the operationof the incident angle adjustment part.

With this type of total internal reflection microscope, the controllerpreferably controls the incident angle adjustment part to obtain thedesired evanescent field penetration depth.

With this type of total internal reflection microscope, the opticaldetector is preferably disposed in a position conjugate to the incidentpupil plane or in the vicinity thereof.

With this type of total internal reflection microscope, the controllerpreferably determines a position of the image of the light source in theincident pupil plane based on the amount of change of the incident angleadjustment part, or the amount of change in the angle formed between theprincipal ray of the light and the optical axis of the relay opticalsystem that changes with the operation of the incident angle adjustmentpart.

With this type of total internal reflection microscope, the controllerpreferably determines at least three or more of the positions on theboundary of total reflection and non-total reflection in the incidentpupil plane, and determines the center of the circle that is theboundary from the positions.

With this type of total internal reflection microscope, the controllerpreferably detects the collecting state of the image of the light sourcerelative to the incident pupil plane based on the change in intensity ofthe returning light when the position of the image of the light sourceis changed in the optical axis direction by the focus lens.

With this type of total internal reflection microscope, the incidentangle adjustment part preferably is on the optical axis of the relayoptical system, is disposed so as to intersect a position conjugate tothe field of vision of the objective lens or in the vicinity thereof,has a reflective surface for reflecting the light, and changes theincident angle by changing the angle of the reflective surface relativeto the optical axis with the point of intersection of the reflectivesurface with the optical axis as the center.

With this type of total internal reflection microscope, the incidentangle adjustment part preferably changes the incident angle by changingthe distance of the light source from the optical axis in the planeorthogonal to the optical axis.

With this type of total internal reflection microscope, the incidentangle adjustment part preferably is on the optical axis of the relayoptical system and changes the incident angle by rotating with aposition conjugate to the field of vision of the objective lens or thevicinity thereof as the center.

Advantageous Effects of Invention

According to the present invention, the illumination angle of a totalinternal reflection microscope can be controlled with good precisionwith a simple configuration.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a descriptive drawing illustrating the configuration of thetotal internal reflection microscope according to the first embodiment.

FIGS. 2A and 2B are descriptive drawings for describing the method ofdetecting the boundary of total reflection and non-total reflection,where FIG. 2A illustrates the change in intensity of the returning lightin the area near the boundary, and FIG. 2B illustrates the positionwithin the detection plane.

FIG. 3 is a descriptive drawing for describing the movement of the spoton the optical detector.

FIG. 4 is a descriptive drawing illustrating the change in intensitywhen moving the spot on the optical detector.

FIG. 5 is a descriptive drawing describing the relationship between themeasurement point on the detection plane and the boundary of totalreflection and non-total reflection.

FIG. 6 is a flow chart of the adjustment method of total reflectionillumination performed by detecting the boundary of total reflection andnon-total reflection.

FIG. 7 is a descriptive drawing for describing the state of the spotwhen operating the focus adjustment lens.

FIG. 8 is a descriptive drawing illustrating the change in intensitywhen operating the focus adjustment lens.

FIG. 9 is a descriptive drawing illustrating the configuration of thetotal internal reflection microscope according to the second embodiment.

FIG. 10 is a descriptive drawing illustrating the configuration of thetotal internal reflection microscope according to the third embodiment.

DESCRIPTION OF EMBODIMENTS First Embodiment

A preferable embodiment of the present invention is described below withreference to the drawings. First, the configuration of a total internalreflection microscope 100 according to the first embodiment is describedusing FIG. 1. The total internal reflection microscope 100 is configuredhaving an illumination optical system 110 for irradiating a sample 12placed on a sample grounded glass 17 installed on a sample base, whichis not pictured, by passing an illumination light LI emitted from alight source 1 through an objective lens 11 from the sample groundedglass 17 side, and an imaging optical system for collecting afluorescence LO generated from the sample 12 which has been excited bythe illumination light LI and collecting it onto the imaging plane of animaging element 19 composed of a CCD or the like. Note that the lightsource 1 in FIG. 1 may be an end surface of an optical fiber directingillumination light emitted from a separate light source device to theillumination optical system 110. The objective lens 11 is a high NAobjective lens that allows for total internal reflection microscopeobservation.

The illumination optical system 110 is configured from a collimatinglens 2 for making the illumination light LI emitted from the lightsource 1 into substantially parallel light, an angle adjustment mirror 3with high angular resolution that is an incident angle adjustment partfor reflecting the illumination light LI emitted from the collimatinglens 2 and adjusting the incident angle when the illuminated light LIirradiates the sample 12, a focus lens 6 for adjusting the parallelismof the illuminated light LI irradiating the sample 12, a relay lens 8composed of at least two lenses for relaying the image of the lightsource 1, a first optical path splitter 9 configured as a dichroicmirror that reflects the illumination light LI toward the objective lens11 and transmits the fluoresce LO generated from the sample 12 or ahalf-mirror (or half-prism) for transmitting one part of the light andreflecting the remaining light, and the sample 12 is disposed on thefocal point on the object side of the objective lens 11. The reflectivesurface of the angle adjustment mirror 3 is displaced so as to intersectthe field of vision of the objective lens 11 on the optical axis 16 at asubstantially conjugate position (in the vicinity of a positionconjugate to the field of vision), and the reflective surface of theangle adjustment mirror 3 is configured to rotate (oscillate) with aposition conjugate the field of vision on the optical axis 16 or thevicinity thereof as the center. Note that the illumination lightprincipal ray 4 is configured to be incident on the rotational center.The angle adjustment mirror 3 is configured to be rotatable in theX-axis direction and the Y-axis direction, where the optical axis 16 isthe Z-axis and the orthogonal directions within a plane orthogonal tothe optical axis 16 are each the X axis and Y axis. The light source 1is disposed so as to substantially unite with the focal point of one ofthe collimating lenses 2. The symbol 10 of FIG. 1 illustrates theposition of the emission pupil (pupil plane) of the objective lens 11,and the symbol 7 illustrates the conjugate position (pupil conjugateplane) of the pupil plane 10.

Also, the imaging optical system 120 is composed of, in order from thesample 12, the objective lens 11, the first optical path splitter 9, andan imaging lens 18, and the imaging plane of the imaging element 19 isdisposed so as to substantially unite with the focal point plane on theimage side of the imaging lens 18.

With this type of a total internal reflection microscope 100, theillumination light LI emitted from the light source 1 is made intosubstantially parallel light by the collimating lens 2 and reflected bythe angle adjustment mirror 3. Then, after it is momentarily collectedby the focus lens 6 at the pupil conjugate plane 7 of the objective lens11 or the vicinity thereof and forms the image of the light source 1, itis relayed by the relay lens 8, reflected by the first optical pathsplitter 9, and is collected at the pupil plane 10 of the objective lens11 or the vicinity thereof and reforms the image of the light source 1.Then, the illumination light LI is collimated by the objective lens 11,made into substantially parallel light, and irradiates the samplegrounded glass 17. At this time, because the principal ray of theillumination light LI is reflected by the angle adjustment mirror 3 soas to form a predetermined angle relative to the optical axis, the imageof the light source 1 is formed at a position apart from the opticalaxis 16 of the pupil plane 10 or the vicinity thereof, and theillumination light LI is irradiated diagonally, with a predeterminedincident angle relative to the sample grounded glass 17. Here, theincident angle refers to the angle formed by the principal ray of theillumination light LI and the normal to the boundary plane of the sample12 and the sample grounded glass 17 (a line substantially parallel tothe optical axis 16). At this time, when the incident angle exceeds thecritical angle of the boundary plane of the sample 12 and the samplegrounded glass 17, the illumination light LI is totally reflected at theboundary plane. Light (evanescent light) permeates and forms anevanescent field on the side of the sample 12 at the boundary plane ofthe sample grounded glass 17 and the sample 12 where the illuminationlight LI is totally reflected, and a range of several tens to severalhundred nm of the thickness of the side of the sample 12 is illuminated.The fluorescence LO is generated from the sample 12, which is excited bythe evanescent light. When the focal point plane on the object side ofthe objective lens 11 is adjusted to be positioned at this position, thefluorescence LO is collected by the objective lens 11, made intosubstantially parallel light, passes through the first optical pathsplitter 9, and collected on the imaging plane of the imaging element 19by the imaging lens 18; an image of the sample 12 is formed by thefluorescence LO. In this manner, a high-contrast image can be obtainedby the total internal reflection microscope 100 because the sample 12can be excited in an extremely dark state with little light noise in thebackground. Note that the position of the image of the light source 1 inthe optical axis direction formed on the pupil conjugate plane 7 or thevicinity thereof is changed by moving the focus lens 6 in the opticalaxis direction, and as a result, the position of the image of the lightsource 1 formed on the pupil plane 10 or the vicinity thereof ischanged. Thus, by uniting the image of the light source 1 with the pupilconjugate plane 7 via the focus lens 6, the image unites with the pupilplane 10, and this allows the illumination light LI irradiating thesample 12 via the objective lens 11 to be made parallel light (theparallelism can be adjusted). Also, the incident angle (the incidentangle relative to the boundary plane) of the illumination light LIirradiating the sample 12 can be adjusted by changing the angle of thereflective surface of the angle adjustment mirror 3 relative to theoptical axis 16.

With this type of the total internal reflection microscope 100, becausethe amount of evanescent light permeating the boundary plane isdependent on the incident angle of the illumination light LI incident onthe boundary plane, the illumination light LI incident on the boundaryplane must be made close to parallel light. Because of this, the totalinternal reflection microscope 100 is equipped with a returning lightdetector 130 for detecting the illuminated light having been totallyreflected at the boundary plane of the sample grounded glass 17 and thesample 12 (this illuminated light is called “returning light” below),and along with distinguishing whether or not the illumination light LIwas totally reflected at the boundary plane of the sample grounded glass17 and the sample 12 with the returning light detector 130, it isconfigured to secure a state of total reflection illumination by theangle of the angle adjustment mirror 3 in the boundary state (criticalstate) of total reflection and non-total reflection.

The returning light detector 130 is composed of a second optical pathsplitter 5 disposed on the optical axis between the focus lens 6 and theangle adjustment mirror 3, a condensing lens 14 disposed on the side ofthe second optical path splitter 5, and an optical detector 15 disposedso one focal point plane of the condensing lens 14 is substantiallyunited with the detection plane. Note that the second optical pathsplitter 5 is composed of a half mirror (or half prism) that transmitsone part of the light and reflects the remaining light. The secondoptical path splitter 5 is disposed on the focal point plane on theimage side of the objective lens 11 or the vicinity thereof, and on theside of the sample 12 from the angle adjustment mirror 3. Note that thesymbol 13 in FIG. 1 illustrates the principal ray of the returninglight.

The illumination light (returning light) that is totally reflected atthe boundary plane of the sample grounded glass 17 and the sample 12 isreflected by the first optical path splitter 9 after being collected onthe pupil plane 10 by the objective lens 11, and is further relayed bythe relay lens 8 and the focus lens 6, and one part of the light isreflected by the second optical path splitter 5. Then, the returninglight reflected by the second optical path splitter 5 is collected ontothe detection plane of the optical detector 15 by the condensing lens14. Here, because the detection plane of the optical detector 15 isdisposed at a position conjugate to the pupil plane 10 of the objectlens 11 or the vicinity thereof, it is possible to detect the collectingstate (focus state) of the illumination light collected on the pupilplane 10 and the collecting position on the pupil plane 10, and when thestate of the illumination light LI collected on the pupil plane 10 ischanged by moving the focus lens 6 in the optical axis direction or theangle adjustment mirror 3 is swung (rotated or moved), it is possible tograsp the state thereof.

Further, concerning the returning light detector 130, it is possible todifferentiate between the total reflection light (the illumination lightLI having been totally reflected at the sample grounded glass 17 and thesample 12) and the reflected light reflected by the sample 12, whichhave an intensity ratio of approximately 100:4, by detecting theintensity of the returning light; it is possible to determine theboundary between total reflection and non-total reflection from theintensity of the light detected by the optical detector 15. Note thatfor this manner of the optical detector 15 of the returning lightdetector 15, it is desired that the CCD or position sensitive detector(PSD) and the like are able to detect the focus state and intensity ofthe light collected on the detection plane. Further, because thedetection plane of the optical detector 15 is substantially conjugate tothe pupil plane 10, it is possible to calculate the total reflectionangle of the illuminated light LI incident on the sample 12, therefractive index of the sample 12, and the evanescent field penetrationdepth by detecting the collecting position on the detection plane;however, the precision thereof depends on the resolution of thedetection element, and the precision is not very high.

Now, a method for adjusting the parallelism and incident angle of theillumination light LI irradiating the sample 12 by detecting the spot ofthe returning light via the optical detector 15 is described. Note thathere, a description is given for a case wherein a CCD is used as thedetector 15, as well a case wherein a position sensitive detector (PSD)is used.

(Case Wherein a CCD is Used as the Detector 15)

First, an adjustment method for a case wherein a CCD is used as thedetector 15 is described. When the focus lens 6 is moved in the opticalaxis direction, the spot diameter of the returning light collected onthe optical detector 15 of the returning light detector 130 changes, andthe peak intensity also changes. Specifically, when the image of thelight source 1 unites with the pupil plane 10, the spot diameterdetected by the optical detector 15 is minimized, and the peak intensityis maximized. That is, by adjusting the focus lens so that the spotdiameter is minimized and the peak intensity is maximized, the image ofthe light source 1 is positioned on the pupil plane 10, and theillumination light irradiating the sample 12 becomes parallel light, andthis causes the illumination angle calculation precision described nextto increase.

A method for adjusting the incident angle of the illumination light LIonto the sample 12 via the angle adjustment mirror 3 is described next.Here, the relationship between the incident angle θ of the illuminationlight LI incident on the sample 12 and the position in the pupil plane10 that the illumination light LI is collected can be found with thefollowing expression (1).

$\begin{matrix}\left\lbrack {{Equation}\mspace{14mu} 1} \right\rbrack & \; \\{\theta = {\sin^{- 1}\left( \frac{h}{n_{1}f} \right)}} & (1)\end{matrix}$

In expression (1), h is the distance from the collecting position of theillumination light LI in the pupil plane 10 to the center of the pupilplane 10, that is, the optical axis 16; n₁ is the refractive index ofthe sample grounded glass 17; and f is the focal distance of theobjective lens 11. Further, when the reference position (0°) is set towhen the angle θ_(m) of the reflective surface of the angle adjustmentmirror 3 is at 45° relative to the optical axis 16, the distance h isfound by the next expression (2) from the angle θ_(m) and the combinedfocal distance f1 of the optical system from the angle adjustment mirror3 to the pupil plane 10. Note that when the reflection angle of theangle adjustment mirror 3 is changed by an angle θ_(m), the light (theprincipal ray of the light) reflected by the reflective surface of theangle adjustment mirror 3 changes by an angle 2θ_(m) relative to theoptical axis.

[Equation 2]

h=f1 sin 2θ_(m)  (2)

Then, when the incident angle θ of the illumination light LI relative tothe vector of the boundary plane between the sample grounded glass 17and the sample 12 exceeds the angle θ_(r) illustrated in the followingexpression (3), the illumination light LI is totally reflected at theboundary plane, and total internal reflection microscope observationbecomes possible.

$\begin{matrix}\left\lbrack {{Equation}\mspace{14mu} 3} \right\rbrack & \; \\{\theta_{r} = {\sin^{- 1}\left( \frac{n_{2}}{n_{1}} \right)}} & (3)\end{matrix}$

Here, n₁ is the refractive index of the sample grounded glass 17, and n₂is the refractive index of the sample 12. In general, it is often thecase that an accurate value for the refractive index of the sample 12 isunknown and the angle of illumination light and the like must be foundby hand when making adjustments for performing total internal reflectionmicroscope observation, but the total internal reflection microscope 100according to the present embodiment is configured so that this value canbe calculated by the method shown below.

The relationship between the incident angle θ of the illumination lightrelative to the sample 12 and the depth of the evanescent field, thatis, the depth range d (depth in the optical axis direction from theboundary plane) of the illumination light hitting the sample 12 isillustrated by the following expression (4). However, λ is thewavelength of the illumination light.

$\begin{matrix}\left\lbrack {{Equation}\mspace{14mu} 4} \right\rbrack & \; \\{d = \frac{\lambda}{4\; \pi \sqrt{{n_{1}^{2}\sin^{2}\theta} - n_{2}^{2}}}} & (4)\end{matrix}$

As is clear from the expression (4), the incident angle θ of theillumination light LI should be adjusted in order to adjust thepenetration depth d of the evanescent field; that is, the collectingposition h of the illumination light LI in the pupil plane 10 should beadjusted with the angle adjustment mirror 3.

As described above, swinging the angle adjustment mirror 3 moves theposition of the image of the light source 1 in the pupil plane 10, andthis causes the spot position of the returning light collected on theoptical detector 15 of the returning light detector 130 to move withinthe detection plane of the detector 15. At this time, in a detectionplane conjugate to the pupil plane 10, when the center of the opticaldetector 15 is orthogonal to the optical axis, the spot intensity of thereturning light changes significantly (FIG. 2A) between the inside andthe outside of a predetermined circle (circle C in FIG. 2B) with thecenter thereof being the center of the detection plane. The spotintensity ratio of the inside and outside of the circle C is 4:100, andwhen the spot is inside the circle C, the illumination light LI is in astate such that it is incident below the total reflection angle at thesample 12, and when the spot is outside the circle C, the illuminationlight LI is in a state such that it is incident above the totalreflection angle at the sample 12. That is, the circle C shows theboundary of total reflection and non-total reflection in the boundaryplane of the sample grounded glass 17 and the sample 12, and by movingthe spot of the returning light in the vicinity of the circle C in thedetection plane of the detector 15 so that it intersects the circle C bychanging the angle of the angle adjustment mirror 3 and detecting theposition where the intensity thereof changes, it can be adjusted to astate wherein the illumination light LI is totally reflected at theboundary plane of the sample grounded glass 17 and the sample 12. Notethat the radius of the circle C is dependent on the magnification of theobjective lens 11, the refractive index of the sample 12, the wavelengthof the illumination light LI, and the like, and while the circle maydeform by the optical element, which is on the optical path, and thecenter of the circle may become offset from the center of the opticalaxis, by determining the angle of total reflection from the intensity ofthe returning light as described above, an adjustment with goodprecision can be performed. For example, in an observation using anobjective lens with magnification 60× and NA 1.49, as illustrated inFIG. 3, circle PI in the detection plane of the optical detector 15corresponds to the pupil diameter of the pupil plane 10, and when thespot W3 is moved so it crosses the circle C from the outside of thecircle PI (along the arrow illustrated in FIG. 3), the relationshipbetween the movement of the spot W3 and the detection intensity can beobtained as illustrated in FIG. 4. The portion with increased intensityis in a state of being totally reflected in the sample plane, and thetotal reflection boundary position can be detected therewith.

When the spot is on the boundary or the outside of the circle C, theillumination light LI is in a state of being incident on the sample 12at the critical angle for total reflection, and with the total internalreflection microscope 100, observation is generally performed in thisvicinity. Note that while it is possible to perform total internalreflection microscope observation by detecting the angle of the angleadjustment mirror 3 that makes the incident angle of the illuminationlight LI incident on the boundary plane of the sample grounded glass 17and the sample 12 become the critical angle for total reflectionaccording to the method described above (can be converted to the angleformed by the light (principal ray of the light) reflected by thereflection plane of the angle adjustment mirror 3 and the optical axis),it is possible to calculate the total reflection angle θ_(r) of theillumination light LI incident on the sample 12 from the position of thespot based on the position (coordinates) and radius of the center of thecircle C, and further, the calculate the refractive index n₂ of thesample 12 and evanescent field penetration depth d based on theexpressions (3) and (4) described above. Specifically, as illustrated inFIG. 5, by performing detection of positions that is totally reflectedat three or more places in the detection plane (for example, at pointsP1-P3 in FIG. 5), the coordinates of the center O of the circle C andthe radius of the circle C can be found from each of these coordinates.

Here, the radius of the circle C can be detected accurately if theangular resolution of the angle adjustment mirror 3 is high, and theprecision thereof depends on the intensity detection resolution of theoptical detector 15, but does not depend on the position detectionresolution. That is, a state of being in the boundary of totalreflection (the circle C) is detected from the optical detector 15, andby calculating the position of the image of the light source 1 in thepupil plane 10 from the angle θ_(m) of the angle adjustment mirror 3,the radius of the circle C can be found with good precision. Generally,the intensity detection resolution of a CCD or position sensitivedetector (PSD) and the like has 256 gradations or more, and issufficiently high for discerning reflection from total reflection andhas little impact on cost.

According to the above procedure, managing the incident angle of theillumination light LI relative to the sample 12 in the total internalreflection microscope 100, that is, the evanescent field penetrationdepth can be performed with high precision and low cost.

Note that as illustrated in FIG. 1, the parallelism and incident angleof the illumination light LI irradiating the sample 12 can be controlledby providing an angle adjustment actuator 51 for rotating the angleadjustment mirror 3 and a position adjustment actuator 52 for moving thefocus lens 6 in the optical axis direction and a controller 50 forcontrolling the operations thereof and controlling the actuators 51 and52 based on the detection results (spot intensity of the returninglight) from the optical detector 15 from the controller 50. Also, aninput part 53 for the observer to operate, a memory part 54 forrecording information for adjusting the total reflection illuminationand images of the sample 12 obtained by the imaging element 19, and adisplay part 55 for displaying and the like of settings information andobtained images are connected to the controller 50. Then, the adjustmentprocess of the total reflection illumination by the controller 50 isdescribed using FIG. 6. Note that here, a case where positions of totalreflection are measured at three points in the detection plane of theoptical detector 15 and adjusted is described.

The controller 50 sets the number N of places to measure for adjustingwhen the start of adjustment processes of total reflection illuminationare indicated (step S400). This number N of measurement places may berecorded beforehand in the memory part 53 or input by the observer fromthe input part 53 (here, N is set to 3 as described above). Then, thecontroller 50 first sets the angle of the angle adjustment mirror 3 byoperating the angle adjustment actuator 51 so that the image of thelight source 1 is formed on the initial position for performingmeasurements on the pupil plane 10, which is the first point (stepS401). Note that because the critical angle at which the illuminationlight LI is totally reflected at the boundary plane of the samplegrounded glass 17 and the sample 12 is determined by the focal lengthand the like of the objective lens 11, the initial position at whichmeasurement is started may be recorded beforehand in the memory part 54for each type of objective lens 11. The angle of the angle adjustmentmirror 3 relative to the optical axis 16 may be found from the operationamount of the angle adjustment actuator 51, or by providing an angledetector separate from the actuator 51 that is configured to detect. Theposition of the focus lens 6 is the same manner. Also, here, asillustrated in FIG. 2, a case wherein it is configured with a pointinside the circle C showing the boundary (critical angle) of totalreflection and non-total reflection (point W1 of FIG. 2B) as the initialpoint is described.

Next, the controller 50 turns on the light source 1 and emitsillumination light (step S402) and operates the position adjustmentactuator 52 and moves the focus lens 6 in the optical axis direction,moving it to a position such that the spot diameter detected by theoptical detector 15 is minimized and the peak intensity is maximized(step S403). This increases the parallelism of the illumination light LIat the current measurement position relative to the sample 12 (at thesample 12, the illumination light LI becomes substantially parallellight). The controller 50 operates the angle adjustment actuator 51 androtates the angle adjustment mirror 3, moves the image of the lightsource 1 in the pupil plane 10 in the direction away from the opticalaxis 16, and as illustrated in FIG. 2A, stops the angle adjustmentmirror 3 at a position (point W2 of FIG. 2B) at which the spot intensitydetected by the optical detector 15 is higher than at the initialposition (step S404), and turns off the light source 1 (step S405). Thecontroller 50 determines the current position (coordinates in the pupilplane 10) of the image of the light source 1 from the angle of the angleadjustment mirror 3 and records it in the memory part 54 (step S406),subtracts 1 from the number N of measurement places (step S407),determines whether the number N of measurement places is larger than 0and repeats the processes S401 through S407 until the number N ofmeasurement places becomes 0 (step S408). Finally, the controller 50finds the center coordinates and radius of the circle C at the criticalangle from the coordinates (angle of the angle adjustment mirror 3) ofthe three places measured as described above (step S409), and from thecenter coordinates and radius of the circle C, the angle θ_(m) of theangle adjustment mirror 3 to provide the evanescent field penetrationdepth d desired by the observer is determined and set by the angleadjustment actuator 51 (step S410), and the adjustment processes oftotal reflection illumination are finished. Note that in step S409, itmay be configured to calculate the refractive index n₂ of the sample 12.

If configured as described above, the focus adjustment via the focuslens 6 (process for uniting the image of the light source 1 with thepupil plane 10) and the adjustment of the angle adjustment mirror 3 toobtain the desired evanescent field penetration depth d can be performedautomatically by the control of the controller 50. At this time, asdescribed above, it is sufficient for the optical detector 15 to be ableto detect the intensity of the returning light, and does not need to beable to identify the position of the spot on the detection plane.

(Case Wherein a PSD is Used as the Optical Detector 15)

A method for adjusting focus in a case wherein a PSD is used as theoptical detector 15 is described next. Before adjusting the focus lens6, the angle adjustment mirror 3 is swung and the spot position of thereturning light on the optical detector 15 is moved. The opticaldetector 15 is conjugate to the pupil plane 10, and as illustrated inFIG. 7, the circle PI in the detection plane of the optical detector 15corresponds to the pupil diameter of the pupil plane 10, and when thespot W4 is moved to the outside of the circle PI, the returning light nolonger reaches the optical detector 15. When the focus lens 6 is movedin the optical axis direction when in a state where the spot W4 is justoutside the circle PI, at the point where the position of the image ofthe light source 1 is about to go outside the pupil plane 10, the spotdiameter of the returning light becomes larger as in W4′ and W4″ of FIG.7, and because the returning light juts out into the circle PI, thereturning light becomes detectable. FIG. 8 shows the change in intensitywhen the focus adjustment lens 6 is moved with the spot W4 of thereturning light in the outer vicinity of the circle PI, when observingusing an objective lens with magnification 60× NA 1.49. When theposition of the image of the light source 1 is removed from the pupilplane 10 in the optical axis direction (a position in front of or behindthe pupil plane in the optical axis direction), the returning light isdetected by the optical detector 15, so the focus lens 6 is moved in theoptical axis direction, and by making the center of the movement range(focus range) of the focus adjustment lens 6 where the returning lightis not detected the optimal position, that is, by making it the positionwhere the image of the light source 1 is formed on the pupil plane 10,the illumination light irradiating the sample 12 becomes parallel, andthis improves the illumination angle detection precision described next.

Note that the method for adjusting the incident angle of theillumination light LI to the sample 12 via the angle adjustment mirror 3is the same as in the case described above where a CCD is used as theoptical detector 15.

Second Embodiment

The total internal reflection microscope 100 according to the firstembodiment is configured to have the illumination light LI is totallyreflected at the boundary plane of the sample grounded glass 17 and thesample 12 by controlling the angle of the angle adjustment mirror 3 thatreflects the illumination light LI from the light source 1, but thetotal internal reflection microscope 200 according to the secondembodiment describes a configuration that moves the light source 1 inthe direction orthogonal to the optical axis 16 as illustrated in FIG.9, and by emitting a principal ray 4 of the illuminated light LI emittedfrom the light source so it is parallel to the optical axis, adjusts theposition of the image of the light source 1 in the pupil plane 10. Notethat constituent members that are the same as in the total internalreflection microscope 100 according to the first embodiment are giventhe same symbols, and the descriptions thereof are omitted.

The principal ray of the illumination light LI emitted from the lightsource 1 proceeds parallel to the optical axis 16, and is converted tosubstantially parallel light by the collimating lens 2. At this time,the light source 1 is held by a light source holding part 20 and isconfigured to move the light source 1 in a direction substantiallyorthogonal to the optical axis 16 while maintaining the emissiondirection of the illumination light from the light source 1. The angleformed between the substantially parallel light emitted from thecollimating lens 2 and the optical axis 16 is determined according tothe distance from the optical axis 16 of the light source 1. Thesubstantially parallel light is transmitted through the second opticalpath splitter 5, collected to a pupil conjugate plane 7 of the objectivelens 11 by the focus lens 6 or the vicinity thereof, further relayed bythe relay lens 8, reflected by the first optical path splitter 9 andforms an image of the light source 1 on the pupil plane of the objectivelens 11 or the vicinity thereof, is made into substantially parallellight by the objective lens 11, and irradiates the boundary plane of thesample grounded glass 17 and the sample 12 at a predetermined angle.Note that the focus adjustment via the focus lens 6 (process for unitingthe image of the light source 1 with the pupil plane 10) is the same asin the first embodiment. In FIG. 9, the configuration of the controller50 and the like are omitted.

In the total internal reflection microscope 200 according to the secondembodiment, the collecting position (position of the image of the lightsource 1) of the illumination light LI in the pupil plane 10, that is,the incident angle θ of the illumination light LI incident on the sample12 is performed by moving the light source 1 in a direction orthogonalto the optical axis, as described above. That is, the light sourceholding part 20 that moves the light source 1 in the optical axisdirection functions as the incident angle adjustment part. Here, thedistance h of the collecting position (position of the image of thelight source 1) of the illumination light LI in the pupil plane 10 andthe optical axis 16 (center of the emission pupil of the objective lens11) is found by the following expression (2′). Note that in thisexpression (2′), p is the projection magnification of the light source 1onto the pupil plane 10, and h₀ is the distance between the light source1 and the optical axis 16.

[Equation 5]

h=βh ₀  (2′)

Even in the total internal reflection microscope 200 according to thesecond embodiment, even if the intensity detection resolution of theoptical detector 15 is low, as long as the resolution for determiningthe position from the optical axis 16 of the light source 1 of the lightsource holding part 20 is high, the incident angle of the illuminationlight LI relative to the sample 12 in the total internal reflectionmicroscope 200, that is, management of the evanescent field penetrationdepth can be performed with high precision and low cost.

Third Embodiment

The total internal reflection microscope 300 according to the thirdembodiment illustrates a configuration wherein the light source 1 andthe collimating lens 2 rotate (swing) as one body, in place of theconfiguration in the total internal reflection microscope 100 accordingto the first embodiment where the angle of the illumination light LIrelative to the optical axis 16 was changed via the angle adjustmentmirror 3. Specifically, the total internal reflection microscope 300 isconfigured so a light source holding part 21 holds the light source 1and the collimating lens 2 as one body and the principal ray 4 of theillumination light LI emitted from the light source 1 and made intosubstantially parallel light by the collimating lens 2 passes through aposition conjugate to the field of vision on the optical axis 16, andthe light source holding part 21 rotates (swings) with the positionconjugate to the field of vision or the vicinity thereof as the center.That is, the light source holding part 21 functions as the incidentangle adjustment part. The rest of the configuration is the same as inthe first embodiment. Also for the total internal reflection microscope300 according to the third embodiment if the resolution of the rotationamount of the light source holding part 21 is high, the management ofthe incident angle of the illumination light LI relative to the sample12, that is the evanescent field penetration depth in the total internalreflection microscope 300 can be performed with high precision and lowcost.

Note that in each embodiment described above, it is preferable for the“vicinity of the pupil plane 10 of the objective lens 11” to be aposition within a range of 5 mm from the pupil plane 10.

Also, regarding the “vicinity of the position conjugate to the pupilplane 10 of the objective lens 11” in each embodiment described above,it is set based on the magnification of the position conjugate to thepupil plane 10 of the objective lens 11. Specifically, the relay lens 8,the focus lens 6, and the condenser lens 14 relate to the setting of themagnification, and if the magnification determined by these three lensesis β_(a) and the vicinity of the pupil plane 10 is 6, the vicinity ofthe conjugate position Δ_(a) is Δ_(a)=δ×β_(a) ². For example, if δ=5 mmand β_(a)=0.5, Δ_(a)=5×0.5²=1.25 mm, so the range becomes 1.25 mm.

To describe the method for setting the “vicinity of the positionconjugate to the field of vision of the objective lens 11 on the opticalaxis 16”, first, the focal depth degree is normally assumed to be thefield of vision position of the objective lens 11, that is, the focusposition. The focal depth Δz is illustrated by the expressionΔz=n×λ/(2×NA²). n is the refractive index of the medium between thesample and the objective lens. λ is the wavelength of the light from thelight source 1, and NA is the NA of the objective lens 11. Then, thevicinity of a position conjugate to the field of vision position is setbased on the magnification determined by the three lenses of theobjective lens 11, the relay lens 8, and the focus lens 6. Then, if themagnification determined by these three lenses is β_(b), the vicinityposition Δ_(b) becomes Δ_(b)=Δz×β_(b) ². For example, with an objectivelens of NA 1.49, refractive index of the medium 1.52, and wavelength ofthe light from the light source 1 is λ=480 nm (blue color), Δz=0.16 μm.Then, if β_(b)=100, the vicinity position Δ_(b) becomesΔ_(b)=Δz×β₁2=0.16×100²=1.6 mm, so the range becomes 1.6 mm.

[Other]

Note that the requirements for each embodiment described above can becombined as suitable. Also, some constituent elements may not be used.Also, within the bounds permitted by law, the disclosure of all JapanesePatent Applications and U.S. Patents relating to the device quoted ineach embodiment and modification described above are claimed as one partof the description given herein.

REFERENCE SIGNS LIST

-   1 Light source-   3 Angle adjustment mirror (incident angle adjustment part)-   6 Focus lens-   8 Relay optical system-   10 Objective lens incident pupil plane (pupil plane)-   11 Objective lens-   12 Sample-   15 Optical detector-   20, 21 Light source holding part (incident angle adjustment part)-   50 Controller-   100 Total internal reflection microscope-   110 Illumination optical system-   200, 300 Total internal reflection microscope

RELATED APPLICATIONS

This is a continuation of PCT International Application No.PCT/JP2014/005474, filed on Oct. 29, 2014, which is hereby incorporatedby reference. This application also claims the benefit of JapanesePatent Application No. 2013-224859, filed in Japan on Oct. 30, 2013,which is hereby incorporated by reference.

1. A total internal reflection microscope comprising an illuminationoptical system for relaying light from a light source with a relayoptical system and forming an image of the light source on the incidentpupil of an objective lens or the vicinity thereof and irradiating asample with the light through the objective lens, total internalreflection microscope comprising: an incident angle adjustment part forchanging the position of the image of the light source in a directionorthogonal to the optical axis, an optical detector for detectingintensity of the returning light that is the light reflected by thesample and collected by the objective lens, and a controller fordetermining the operation amount of the incident angle adjustment part,wherein the controller determines the operation amount of the incidentangle adjustment part based on the change in intensity of the returninglight when the incident angle adjustment part is changed.
 2. The totalinternal reflection microscope according to claim 1, further comprisinga focus lens for changing the position of the image of the light sourcein the optical axis direction, wherein the controller determines theoperation amount of the incident angle adjustment part and the focuslens based on the change in intensity of the returning light when theincident angle adjustment part and the focus lens are changed.
 3. Thetotal internal reflection microscope according to claim 1, wherein thecontroller determines the operation amount of the incident angleadjustment part so the light is totally reflected at the sample based onthe change in intensity of the returning light when the incident angleadjustment part is changed, and determines the operation amount of thefocus lens so the light becomes parallel light based on the change inintensity of the returning light when the focus lens is changed.
 4. Thetotal internal reflection microscope according to claim 1, wherein thecontroller adjusts the position of the light source image in a directionorthogonal to the optical axis direction in the incident pupil of theobjective lens or the vicinity thereof so that the light is totallyreflected at the sample, and adjusts the position of the light sourceimage in the optical axis direction in the incident pupil of theobjective lens or the vicinity thereof so that the light becomesparallel light.
 5. The total internal reflection microscope according toclaim 1, wherein the controller identifies the boundary of totalreflection in the sample and non-total reflection in the sample based onthe change in intensity of the returning light.
 6. The total internalreflection microscope according to claim 1, wherein the controllercalculates the incident angle of the light relative to the sample basedon the amount of change of the incident angle adjustment part or theamount of change in the angle formed between the principal ray of thelight and the optical axis of the relay optical system, which changeswith the operation of the incident angle adjustment part.
 7. The totalinternal reflection microscope according to claim 1, wherein thecontroller calculates at least one of either the refractive index of thesample or the evanescent field penetration depth based on the amount ofchange of the incident angle adjustment part, or the amount of change inthe angle formed between the principal ray of the light and the opticalaxis of the relay optical system that changes with the operation of theincident angle adjustment part.
 8. The total internal reflectionmicroscope according to claim 1, wherein the controller controls theincident angle adjustment part to obtain the desired evanescent fieldpenetration depth.
 9. The total internal reflection microscope accordingto claim 1, wherein the optical detector is disposed in a positionconjugate to the incident pupil plane or the vicinity thereof.
 10. Thetotal internal reflection microscope according to claim 9, wherein thecontroller determines a position of the image of the light source in theincident pupil plane based on the amount of change of the incident angleadjustment part, or the amount of change in the angle formed between theprincipal ray of the light and the optical axis of the relay opticalsystem that changes with the operation of the incident angle adjustmentpart.
 11. The total internal reflection microscope according to claim10, wherein the controller determines at least three or more of thepositions on the boundary of total reflection and non-total reflectionin the incident pupil plane, and determines the center of the circlethat is the boundary from the positions.
 12. The total internalreflection microscope according to claim 9, wherein the controllerdetects the collecting state of the image of the light source relativeto the incident pupil plane based on the change in intensity of thereturning light when the position of the image of the light source ischanged in the optical axis direction by the focus lens.
 13. The totalinternal reflection microscope according to claim 1, wherein theincident angle adjustment part is on the optical axis of the relayoptical system, is disposed so as to intersect a position conjugate tothe field of vision of the objective lens or the vicinity thereof, has areflective surface for reflecting the light, and changes the incidentangle by changing the angle of the reflective surface relative to theoptical axis with the point of intersection of the reflective surfacewith the optical axis as the center.
 14. The total internal reflectionmicroscope according to claim 1, wherein the incident angle adjustmentpart changes the incident angle by changing the distance of the lightsource from the optical axis in the plane orthogonal to the opticalaxis.
 15. The total internal reflection microscope according to claim 1,wherein the incident angle adjustment part is on the optical axis of therelay optical system and changes the incident angle by rotating with aposition conjugate to the field of vision of the objective lens or thevicinity thereof as the center.